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transmission polarization microscopy  (Oxford Instruments)
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Oxford Instruments transmission polarization microscopy
( a ) Scheme of the transmission <t>polarization</t> <t>microscopy</t> experimental setup exhibiting the possibility of focusing the laser beam onto the sample’s surface with highlighted types of crystallographic orientations; the inset shows the beam profile at the focusing spot (measured by “knife-edge” method). ( b ) Image of the sample’s domain structure. ( c ) Hysteresis loops measured in the longitudinal magneto-optical Kerr effect (MOKE) geometry with the external field applied along the in-plane easy axis (EA) and along the hard axis (HA).
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polarization microscopy  (Thorlabs)
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Thorlabs polarization microscopy
( a ) Scheme of the transmission <t>polarization</t> <t>microscopy</t> experimental setup exhibiting the possibility of focusing the laser beam onto the sample’s surface with highlighted types of crystallographic orientations; the inset shows the beam profile at the focusing spot (measured by “knife-edge” method). ( b ) Image of the sample’s domain structure. ( c ) Hysteresis loops measured in the longitudinal magneto-optical Kerr effect (MOKE) geometry with the external field applied along the in-plane easy axis (EA) and along the hard axis (HA).
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polarized light microscopy  (Olympus)
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Olympus polarized light microscopy
( a ) Scheme of the transmission <t>polarization</t> <t>microscopy</t> experimental setup exhibiting the possibility of focusing the laser beam onto the sample’s surface with highlighted types of crystallographic orientations; the inset shows the beam profile at the focusing spot (measured by “knife-edge” method). ( b ) Image of the sample’s domain structure. ( c ) Hysteresis loops measured in the longitudinal magneto-optical Kerr effect (MOKE) geometry with the external field applied along the in-plane easy axis (EA) and along the hard axis (HA).
Polarized Light Microscopy, supplied by Olympus, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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reflection contrast polarized light microscopy  (Danaher Inc)
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Danaher Inc reflection contrast polarized light microscopy
( a ) Scheme of the transmission <t>polarization</t> <t>microscopy</t> experimental setup exhibiting the possibility of focusing the laser beam onto the sample’s surface with highlighted types of crystallographic orientations; the inset shows the beam profile at the focusing spot (measured by “knife-edge” method). ( b ) Image of the sample’s domain structure. ( c ) Hysteresis loops measured in the longitudinal magneto-optical Kerr effect (MOKE) geometry with the external field applied along the in-plane easy axis (EA) and along the hard axis (HA).
Reflection Contrast Polarized Light Microscopy, supplied by Danaher Inc, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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reflection contrast polarized light microscopy - by Bioz Stars, 2026-07
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leica dm750 light microscopy  (Danaher Inc)
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Danaher Inc leica dm750 light microscopy
( a ) Scheme of the transmission <t>polarization</t> <t>microscopy</t> experimental setup exhibiting the possibility of focusing the laser beam onto the sample’s surface with highlighted types of crystallographic orientations; the inset shows the beam profile at the focusing spot (measured by “knife-edge” method). ( b ) Image of the sample’s domain structure. ( c ) Hysteresis loops measured in the longitudinal magneto-optical Kerr effect (MOKE) geometry with the external field applied along the in-plane easy axis (EA) and along the hard axis (HA).
Leica Dm750 Light Microscopy, supplied by Danaher Inc, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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binocular dm750 m microscopy  (Danaher Inc)
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Danaher Inc binocular dm750 m microscopy
( a ) Scheme of the transmission <t>polarization</t> <t>microscopy</t> experimental setup exhibiting the possibility of focusing the laser beam onto the sample’s surface with highlighted types of crystallographic orientations; the inset shows the beam profile at the focusing spot (measured by “knife-edge” method). ( b ) Image of the sample’s domain structure. ( c ) Hysteresis loops measured in the longitudinal magneto-optical Kerr effect (MOKE) geometry with the external field applied along the in-plane easy axis (EA) and along the hard axis (HA).
Binocular Dm750 M Microscopy, supplied by Danaher Inc, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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optical microscopy  (Danaher Inc)
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Danaher Inc optical microscopy
Optical <t>microscopy</t> images of the glass surface morphologies before cleaning.
Optical Microscopy, supplied by Danaher Inc, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


( a ) Scheme of the transmission polarization microscopy experimental setup exhibiting the possibility of focusing the laser beam onto the sample’s surface with highlighted types of crystallographic orientations; the inset shows the beam profile at the focusing spot (measured by “knife-edge” method). ( b ) Image of the sample’s domain structure. ( c ) Hysteresis loops measured in the longitudinal magneto-optical Kerr effect (MOKE) geometry with the external field applied along the in-plane easy axis (EA) and along the hard axis (HA).

Journal: Nanomaterials

Article Title: Laser-Induced Reconfiguration of Magnetic Domain Structure in Iron Garnet Films with Strong In-Plane Anisotropy

doi: 10.3390/nano15231830

Figure Lengend Snippet: ( a ) Scheme of the transmission polarization microscopy experimental setup exhibiting the possibility of focusing the laser beam onto the sample’s surface with highlighted types of crystallographic orientations; the inset shows the beam profile at the focusing spot (measured by “knife-edge” method). ( b ) Image of the sample’s domain structure. ( c ) Hysteresis loops measured in the longitudinal magneto-optical Kerr effect (MOKE) geometry with the external field applied along the in-plane easy axis (EA) and along the hard axis (HA).

Article Snippet: The micromagnetic structure was visualized using “white light” illumination and transmission polarization microscopy (Faraday geometry) ( a) with a WITec alpha 300S microscope (Ulm, Germany).

Techniques: Transmission Assay, Microscopy

Optical microscopy images of the glass surface morphologies before cleaning.

Journal: RSC Advances

Article Title: Improved tribological performance of silica glass via surface texturing by chemical etching

doi: 10.1039/d5ra06230f

Figure Lengend Snippet: Optical microscopy images of the glass surface morphologies before cleaning.

Article Snippet: Optical microscopy (DM750, Leica, Wetzlar, Germany) were used to observe the surface morphology before and after cleaning to analyze the influence of etching time on the surface topography.

Techniques: Microscopy

Optical microscopy images of the glass surface morphologies after cleaning.

Journal: RSC Advances

Article Title: Improved tribological performance of silica glass via surface texturing by chemical etching

doi: 10.1039/d5ra06230f

Figure Lengend Snippet: Optical microscopy images of the glass surface morphologies after cleaning.

Article Snippet: Optical microscopy (DM750, Leica, Wetzlar, Germany) were used to observe the surface morphology before and after cleaning to analyze the influence of etching time on the surface topography.

Techniques: Microscopy

Scanning electron microscopy images of wear tracks formed on glass samples after sliding tests.

Journal: RSC Advances

Article Title: Improved tribological performance of silica glass via surface texturing by chemical etching

doi: 10.1039/d5ra06230f

Figure Lengend Snippet: Scanning electron microscopy images of wear tracks formed on glass samples after sliding tests.

Article Snippet: Optical microscopy (DM750, Leica, Wetzlar, Germany) were used to observe the surface morphology before and after cleaning to analyze the influence of etching time on the surface topography.

Techniques: Electron Microscopy